Fab capacity planner

Chip Sense / Tools / Fab capacity planner

Estimates only. These tools are illustrative what-if calculators for teaching and writing — not forecasts, quotes, fab plans, or legal/compliance advice. Defaults are curated teaching values; replace them with your own inputs.

Fab capacity planner

Accounting identity for teaching: good dies/month ≈ WSPM × DPW × yield × utilization. Enter WSPM yourself — we do not invent unpublished fab throughput.

Methodology

How to use

Review Assumptions on the left. Amber badges are teaching estimates; they become Your input when you edit.
Enter wafer starts per month (WSPM) — we leave this blank so you supply a cited or assumed figure.
Adjust DPW, yield, and utilization, or seed them from the Yield tool.
Read effective wafer starts and good dies per month/year under your assumptions.
Read Estimated results on the right (~ means estimate). Use Reset or Methodology anytime.

Assumptions

Edit any field — values you change are treated as your input, not Chip Sense published facts.

Wafer starts / month (WSPM)EstimatewafersLeft at 0 on purpose — enter a cited or assumed WSPM. Public capacity figures are often missing or outdated.Dies per waferEstimatediesSeed from the Yield estimator good-die geometry, or enter your DPW.Die yieldEstimatefraction 0–1Teaching default die yield (70%). Override with Yield estimator output.UtilizationEstimatefraction 0–1Illustrative fab utilization (85%). Not a measured OEE.

Estimated results

Outputs use ~ / ranges on purpose. Basis: your current assumptions.

Enter a wafer-starts-per-month (WSPM) value to see throughput estimates. Prefer cited IR/news figures when you have them; otherwise treat the input as your assumption.

Effective wafer starts / month

Estimate

—wafers

WSPM × utilization (~85.0%).

Good dies / month

Estimate

—dies

Effective starts × DPW × die yield.

Good dies / year

Estimate

—dies

Month × 12 (no downtime calendar model).

Tip: seed DPW / yield from the Yield estimator.